Multi-Sample Test Control System for Dielectric Property

Multi-Sample Test Control System for Dielectric Property

Testing at Cryogenic Temperatures

SHARAT CHANDRA KOUSHIK KARTALA

Project Requirements for the Degree of

MASTER OF SCIENCE IN ELECTRICAL ENGINEERING

August 2012

ABSTRACT

MeMDRL (Multifulctional Electronic Materials Devices Research Lab) currently has a fully equipped dielectric measurement system, which can measure one sample at a time. This measurement system calculates the capacitance and dissipation of the dielectric material sample at various temperatures and frequencies. The latest equipments currently available in the market can conduct the tests for about 4 samples at a time.

Multi-Sample Test Control (MSTC) System is designed, fabricated and tested to perform the experiments with up to four samples at a time. The current test setup is made to measure up to four samples at a time. This MSTC system is mainly controlled through LabView. It is also accessible with a manual override switch to do the switching of the samples placed in the cryogenic chamber locally. The complete process upon further modification is to enable remote laboratory operations.

References:

1) Fawwzat T, Ulaby, Microwave dielectric properties of dry rocks.

2) Binzaid, S. and Attia, J. O., (1996): Design of a Switched Capacitor SRAM IC, RADSCON'96, Radiation Studies Conference, NASA-CARR, NASA Center for Applied Radiation Research, pp. 55-61.

3) Labview http://www.ni.com/labview/

4) Peter A. Stark (2004) “High Pass and Low Pass Filters” Chapter 20 Page 20-2. http://www.users.cloud9.net/~stark/elchap20.pdf.

5) Brian S. Kim, Wang Zhou, Yash D. Shah, Chuanle Zhou, N. Isik and M. Grayson, “Generalized four-point characterization method for resistive and capacitive contacts”