| Indices of refraction measurement in bulk materials (minimum deviation method) in visible and near IR frequencies (room temperature to 600oC) and in films (micro focused ellipsometer) at 633 nm. |
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| Linear and quadratic electrooptic coefficient measurement (Senarmont compensation and modified Mach-Zehnder method) |
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| High sensitivity Chynoweth dynamic pyroelectric and pyrooptic measurement system. |
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| He-Ne lasers, laser diodes and IR fiber lasers, high power CO2 (Edinburgh and Apollo) flowing gas laser, Nd:YAG laser (Spectra-Physics with phase lock and Quatronix with Q-switch) with SHG and THG output, and dye lasers (Sirah and Coherent) with pulsed and CW laser output. |
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| Optic/Microwave probe station equipped with micro-movement control, CCD camera and TV display, and adapted with micro-tweezers capable of precision handling of micron-sized samples and thin film samples. |
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